Chemical Analysis of CdMnTeSe Surface Treated with Sodium Hypochlorite and Potassium Permanganate via X-ray Photoelectron Spectroscopy
We grew a Cd 0.95 Mn 0.05 Te 0.98 Se 0.02 (CMTS) semiconductor, which is the next-generation gamma-ray detector operating at room temperature, via the Bridgman method.During Br etching, one of the fabrication processes for CdTe-based semiconductors, a Te-rich layer is formed on the surface of the crystal, and this Te-rich surfaces act as the charge carrier source and trapping center of photo-generated carriers.To oxidize this Te-rich layer, we introduced sodium hypochlorite (NaOCl) and potassium manganate (KMnO 4 ) into CMTS crystals, and then characterized the chemical state of the surface via X-ray photoelectron spectroscopy (XPS).The spectroscopic properties of the surface-treated CMTS were confirmed, indicating potential oxidation when precise passivation was settled.
Authors
- Beomjun Park (ORCID: https://orcid.org/0000-0002-7822-9919)
- Masanori Koshimizu (ORCID: https://orcid.org/0000-0002-0905-2144)
- Younghak Kim (ORCID: https://orcid.org/0000-0002-5956-1254)
- Jangwon Byun (ORCID: https://orcid.org/0000-0001-8239-1794)
- Seung-Ho Song (ORCID: https://orcid.org/0000-0003-1893-1674)
- Hansoo Kim (ORCID: https://orcid.org/0000-0002-0886-583X)
- Jae M. Seo (ORCID: https://orcid.org/0000-0003-3308-3060)
- Ting‐Shan Mo (ORCID: https://orcid.org/0009-0003-5483-9389)
- Jiwon Seo (ORCID: https://orcid.org/0000-0002-5345-9224)
Publication Details
- Journal
- Sensors and Materials
- Published
- 2025-05-22
- DOI
- https://doi.org/10.18494/sam5513
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Research Foundation
- Korea Atomic Energy Research Institute
- National Research Foundation of Korea
- Ministry of Science and ICT, South Korea