The Application of Electric Feed-in with the Low Sensitivity and Low Spatial Resolution Probe
This study presents a design method for a non-contact probe suitable for electric field injection. The probe is fabricated using an FR4 double-layer and single-layer board process, with screws securing it through positioning holes. The simulated bandwidth spans from 300 <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$\text{kHz}$</tex> to 20 GHz, achieving a sensitivity range of <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$-30 \ \text{to} \ -40 \ \text{dB}$</tex>. The resolution varies from 2.49 mm to 2.14 mm, decreasing as the frequency increases, which enhances its applicability for small-scale electric field injection. Measurements up to 6 GHz demonstrate accuracy closely aligned with the simulation results.
Authors
- Yueh‐Cheng Kuo
- Hong Guan (ORCID: https://orcid.org/0000-0001-5053-5052)
- Yu-Zhi Ma
- Sung-Mao Wu
- Shin-Shian Wu
- Tsai-Feng Wu
Institutions
- National University of Kaohsiung (TW)
Publication Details
- Published
- 2025-04-15
- DOI
- https://doi.org/10.23919/icep-iaac64884.2025.11002994
- Primary Topic
- Surface Roughness and Optical Measurements
- Type
- article
- Field-Weighted Citation Impact
- 0.00