Accuracy Enhancement of Resistor-String Digital-to-Analog Converters through Averaging Dynamic Element Matching

In integrated Digital-to-Analog Converters (DACs), random mismatch errors among nominally equal unit elements significantly limit the achievable accuracy. This work explores the effectiveness of tailored Dynamic Element Matching (DEM) techniques in mitigating mismatch-induced non-linearity errors in resistor-string DAC architectures. Through statistical behavioural simulations, we identify effective DEM strategies that substantially reduce Integral Non-Linearity (INL). The proposed technique enables virtually zero INL errors at specific points of the transfer characteristic, which can be strategically chosen during circuit operation. Insofar, optimized design approaches for resistor-string DACs are proposed, fostering future integratedcircuit implementations with superior yield concerning accuracy and linearity specifications.