A Bandgap Diode-Based Voltage Band Detection Circuit With Fast Response Time and Low Vmin on Intel 4 Logic Technology
A fast, accurate, single-rail voltage detection circuit (VDC) is presented. Low voltage operation is achieved by a variable gain Charge Pump (CP) followed by a Low-Dropout regulator (LDO). An Open-loop Band Gap Reference (BGREF), passed to a dynamic comparator, achieves an undervoltage trip point of 0.62V with 8.7mV sigma, and an overvoltage trip point of 1.22V with 12mV sigma, demonstrated on Intel 4 silicon prototype. The design operates without any filter cap, allowing a fast, power-on ramp of 2ls, and brown-out detection of <200ns. A voltage band detection of 0.48-1.22V is enabled through a finite-state machine (FSM) to modify CP and LDO gain depending on input voltage.
Authors
- Jaydeep P. Kulkarni (ORCID: https://orcid.org/0000-0002-0258-6776)
- Atresh Sanne
- Mohammad M. Hasan (ORCID: https://orcid.org/0000-0001-8702-4811)
- Stafford Hutchins (ORCID: https://orcid.org/0000-0003-4619-7438)
- Zhanping Chen (ORCID: https://orcid.org/0000-0002-2844-459X)
- Kedar Bhatt (ORCID: https://orcid.org/0000-0003-4251-2939)
Institutions
- Intel (United States) (US)
- The University of Texas at Austin (US)
Publication Details
- Journal
- IEEE Solid-State Circuits Letters
- Published
- 2025-01-01
- DOI
- https://doi.org/10.1109/lssc.2025.3572385
- Primary Topic
- Analog and Mixed-Signal Circuit Design
- Type
- article
- Field-Weighted Citation Impact
- 0.00