Material Property Extraction Using Microstrip Antennas for mm- Wave Applications

To meet the demand for high-speed circuits in advanced packaging, this study proposes a microstrip antenna-based method for accurate dielectric constant <tex xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">$(D_{k})$</tex> extraction, focusing on high-frequency and millimeter-wave (mm-Wave) applications. Traditional methods, such as the Phase Delay [1] and Pole-Zero [2] techniques, often lack accuracy at mm-Wave frequencies due to their inability to account for radiation loss. To address this issue, microstrip antennas operating at 2.4 GHz, 5 GHz, and 28 GHz were designed and used to extract dielectric constant for FR-4 and PTFE (polytetrafluoroethylene) substrates. The extracted values were validated by comparing simulation and experimental measurements, demonstrating consistent and reliable results across different frequency bands. The proposed approach demonstrates superior accuracy and reliability compared to conventional methods, making it a promising solution for substrate characterization. This method supports the development of high-speed circuits and mm- Wave antenna designs, offering valuable applications in advanced packaging and high-frequency electronic systems.