Cu Metallized Glass Core Evaluation & Testing Method

For applications such as high-speed transmission, 5G communication, HPC, and new optical devices, a substrate that does not absorb moisture, has small CTE, and has less warpage is required. This paper will show the evaluation & testing method for direct wet Cu metallization on Glass TGV (thru-glass via) technology. Cu metalized glass core is very important, but there are no standards for evaluation and test methods. Therefore, the current situation is that differences in evaluation and inspection conditions lead to large variations and inappropriate results, leading to incorrect judgments. Although there is no unified standard yet, disclosing the current conditions, it will be one of as a guideline for future measurement, evaluation, and test conditions.