Validation of Ray-tracing Tool Utilizing Multi-band Measurements in Industrial Scenarios up to THz Frequencies

In this work, we introduce a thorough comparison between ray tracing (RT) simulations and multi-band measurements in a complex scenario such as an industrial environment. The RT model was generated from precise 3D laser scans in a small machinery room. A 3D model was recreated and processed using commercial and non-commercial software. Simultaneously, double-directional dual-polarized ultra-wideband measurements at 6 GHz, mmWave, sub-THz, and THz were also carried out for calibration and validation purposes. The RT simulations were conducted in the open-source tool for physical channel modeling Sionna. Afterwards, the measurement set-up was emulated by embedding the measurement bandwidth and antenna patterns into the RT simulations for a fair comparison. The results show a good agreement on the location of the dominant scatterers.