E-band Active Transmitarray Characterization Using Selective Element Illumination

A transmitarray (TA)-characterization method utilizing selective element illumination (SEI) using a metallic mask to isolate individual elements is described. This method allows for the effective turning off of all other elements while having minimal effect on the illumination of the desired element. The impact of the mask is analyzed through the electric fields on the aperture of the TA and the measured radiation patterns with and without the mask present. Compared to other element-isolation methods, using a mask preserves more detail in the embedded element pattern (EEP), better representing the true performance of the element as a part of the TA.