Thermomechanical FEM Analysis of Sn-Bi Solder Joint During Temperature Cycling for Fine Pitch 1st Level Interconnect
Thermomechanical analysis by finite element method (FEM) was performed for Sn-Bi and Sn-Ag-Cu (SAC) solder joints with pitches of 130 microns and 40 microns in a 2D package during a temperature cycling (TC) test. The results showed a smaller inelastic strain range of solder for the Sn-Bi joints than the SAC joints. Inelastic strain ranges for Sn-Bi and SAC increase when the joint size decreases from the C4 to the Cu pillar. However, the increasing rate for Sn-Bi is remarkably smaller than that for SAC.
Authors
- Masahiro Tsuriya
- Yasuharu Yamada (ORCID: https://orcid.org/0000-0002-0442-8325)
- Russell Kastberg
- Sze Pei Lim
- Sayuri Kohara
- Toyohiro Aoki
- Gokhale Shripad
Institutions
- IBM (United States) (US)
- Intel (United States) (US)
- IBM Research - Tokyo (JP)
Publication Details
- Published
- 2025-04-15
- DOI
- https://doi.org/10.23919/icep-iaac64884.2025.11003021
- Primary Topic
- Electronic Packaging and Soldering Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00