Thermomechanical FEM Analysis of Sn-Bi Solder Joint During Temperature Cycling for Fine Pitch 1st Level Interconnect

Thermomechanical analysis by finite element method (FEM) was performed for Sn-Bi and Sn-Ag-Cu (SAC) solder joints with pitches of 130 microns and 40 microns in a 2D package during a temperature cycling (TC) test. The results showed a smaller inelastic strain range of solder for the Sn-Bi joints than the SAC joints. Inelastic strain ranges for Sn-Bi and SAC increase when the joint size decreases from the C4 to the Cu pillar. However, the increasing rate for Sn-Bi is remarkably smaller than that for SAC.

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Publication Details

Published
2025-04-15
DOI
https://doi.org/10.23919/icep-iaac64884.2025.11003021
Primary Topic
Electronic Packaging and Soldering Technologies
Type
article
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Thermomechanical FEM Analysis of Sn-Bi Solder Joint During Temperature Cycling for Fine Pitch 1st Level Interconnect

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Electronic Packaging and Soldering Technologies
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Thermomechanical FEM Analysis of Sn-Bi Solder Joint During Temperature Cycling for Fine Pitch 1st Level Interconnect

Masahiro Tsuriya, Yasuharu Yamada, Russell Kastberg, Sze Pei Lim, Sayuri Kohara, Toyohiro Aoki, Gokhale Shripad
article en

Abstract

Thermomechanical analysis by finite element method (FEM) was performed for Sn-Bi and Sn-Ag-Cu (SAC) solder joints with pitches of 130 microns and 40 microns in a 2D package during a temperature cycling (TC) test. The results showed a smaller inelastic strain range of solder for the Sn-Bi joints than the SAC joints. Inelastic strain ranges for Sn-Bi and SAC increase when the joint size decreases from the C4 to the Cu pillar. However, the increasing rate for Sn-Bi is remarkably smaller than that for SAC.

IBM (United States) (US), Intel (United States) (US), IBM Research - Tokyo (JP)
Openalex Percentile: Top 91%
Electronic Packaging and Soldering Technologies
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