Eddy Current Defect Tomography Using a Hybrid Binary Vector Recovery Algorithm
This article presents an eddy current tomography framework for imaging defects in metal structures. The tomography problem is formulated as a linear inverse problem with a binary solution vector. A Bayesian approach is utilized, incorporating a binary-inducing prior and determining the posterior probability conditioned on the measurements. Since recovering binary vectors from underdetermined linear measurements is NP-hard, an approximation to the true posterior is obtained by minimizing a Kullback-Leibler (KL) divergence. Alternatively, a convex optimization approach relaxes the binary constraint and applies alternating direction method of multipliers (ADMM) to compute a solution. The convergence of both algorithms is proven. To improve computational efficiency, the two algorithms are cascaded and augmented with a decomposition technique to form a hybrid algorithm. The proposed framework is validated experimentally with a prototype eddy current sensing probe, demonstrating the ability to image defects as small as 1 mm at various depths using a sensor array with 4 mm spacing.
Authors
- Chun-Yeon Lin (ORCID: https://orcid.org/0000-0003-4585-5881)
- Wei-Chen Li (ORCID: https://orcid.org/0009-0005-9899-3753)
Institutions
- National Taiwan University (TW)
Publication Details
- Journal
- IEEE/ASME Transactions on Mechatronics
- Published
- 2025-05-20
- DOI
- https://doi.org/10.1109/tmech.2025.3565800
- Primary Topic
- Non-Destructive Testing Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00