WOM-FTL: An Efficient FTL for High-Density Flash Memory Through WOM-v Codes
High-density NAND flash memory, such as quadruple-level cell (QLC) flash, has has been widely adopted in emerging storage systems. However, its limited endurance and performance challenges necessitate novel solutions. Voltage-based write-once memory (WOM-v) codes have demonstrated their effectiveness in extending flash memory lifespan by reducing the erase count of flash blocks. Concurrently, secure deletion is essential to ensure data privacy in flash-based storage systems. Existing secure deletion approaches—encryption-based, erasure-based, and scrubbing-based—often face limitations such as susceptibility to deciphering or significant performance overheads. Additionally, the inherent “big block problem” in high-density flash memory complicates garbage collection (GC), further degrading system performance. To address these challenges, this paper proposes WOM-FTL, a flash translation layer (FTL) that integrates secure deletion and garbage collection (GC) with WOM-v codes to enhance both security and performance. WOM-FTL classifies request data into four categories based on access frequency and privacy requirements: hot-secure (HS), cold-secure (CS), hot-unsecure (HU) and cold-unsecure (CU). Additionally, WOM-FTL divides each block into several equal-sized sub-blocks and further classifies them into top sub-blocks and bottom sub-blocks according to their data storage characteristics. When a secure data deletion command is issued to the storage device, WOM-FTL leverages unsecure data (HU and CU) to overwrite the secure data (HS and CS). Furthermore, WOM-FTL allocates different types of request data to the corresponding sub-blocks, creating a data allocation pattern that is both scrubbing-friendly and GC-friendly. Experimental results demonstrate that WOM-FTL improves the I/O performance of storage systems by 60.91% compared to state-of-the-art solutions, providing a significant advancement in secure and efficient management of high-density flash memory.
Authors
- Chang Wen (ORCID: https://orcid.org/0000-0002-8539-8630)
- Shiqiang Nie (ORCID: https://orcid.org/0000-0003-2215-7159)
- Laurence T. Yang (ORCID: https://orcid.org/0000-0002-7986-4244)
- Yaliang Zhao (ORCID: https://orcid.org/0000-0002-7117-605X)
- Kai Tang (ORCID: https://orcid.org/0000-0002-5184-2086)
- Jinhua Cui (ORCID: https://orcid.org/0000-0002-3252-7937)
- Debin Liu (ORCID: https://orcid.org/0000-0001-5233-9637)
Institutions
- Henan University (CN)
- Zhengzhou University (CN)
- Huazhong University of Science and Technology (CN)
- Xi'an Jiaotong University (CN)
Publication Details
- Journal
- IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
- Published
- 2025-05-20
- DOI
- https://doi.org/10.1109/tcad.2025.3571833
- Primary Topic
- Advanced Data Storage Technologies
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- National Natural Science Foundation of China
- Fundamental Research Funds for the Central Universities