On the Cover: Sequential Progression and Item Review in Timed Tests: Patterns in Process Data

We are excited to announce the winners of the 12th EM:IP Cover Graphic/Data Visualization Competition.Each year, we invite our readers to submit visualizations that are not only accurate and insightful but also visually compelling and easy to understand.This year's submissions explored key topics in educational measurement, including process data, item characteristics, test design, and score interpretation.We extend our sincere thanks to everyone who submitted their work,

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Publication Details

Journal
Educational Measurement Issues and Practice
Published
2025-05-20
DOI
https://doi.org/10.1111/emip.12670
Primary Topic
Psychometric Methodologies and Testing
Type
article
Field-Weighted Citation Impact
0.00
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article

On the Cover: Sequential Progression and Item Review in Timed Tests: Patterns in Process Data

Yuan‐Ling Liaw
Educational Measurement Issues and Practice
Psychometric Methodologies and Testing
article

On the Cover: Sequential Progression and Item Review in Timed Tests: Patterns in Process Data

Yuan‐Ling Liaw
article en

Abstract

We are excited to announce the winners of the 12th EM:IP Cover Graphic/Data Visualization Competition.Each year, we invite our readers to submit visualizations that are not only accurate and insightful but also visually compelling and easy to understand.This year's submissions explored key topics in educational measurement, including process data, item characteristics, test design, and score interpretation.We extend our sincere thanks to everyone who submitted their work,

Educational Measurement Issues and PracticeVol. 44(2)
Association of American Medical Colleges (US)
Openalex Percentile: Top 88%
Psychometric Methodologies and Testing
DOIOpen Access PDFOpenAlex
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On the Cover: Sequential Progression and Item Review in Timed Tests: Patterns in Process Data — Yuan‐Ling Liaw · Educational Measurement Issues and Practice (2025) | TGRS Research Map | TGRS