Back to Basics: Energy Resolution of Room Temperature Semiconductor Detectors Through the Lens of BiI <sub>3</sub>

Abstract The energy resolution of the prototype spectrometer is one of the most cited figures when reporting the development of new promising room‐temperature semiconductor detectors (RTSDs) for gamma‐ray spectroscopy. As the search for new materials has expanded beyond the traditional nuclear field, it is important to recall best practices on how to characterize the energy resolution of a detector so that it can be properly compared with previously reported data in the literature and more effectively advance the field forward. Here, as part of this special edition, the path toward reporting comparable energy resolution is presented through the case study of BiI 3 . Notwithstanding the essential optimization of single crystal growth, and detector manufacturing processes, as well as the fine‐tuning of detector electronics required for taking a promising material into a deployable detector, the evolution that took BiI 3 single crystals detectors from barely able to collect a 241 Am alpha spectrum to a first‐ever 241 Am gamma spectrum, and eventually to demonstrate a 137 Cs 662 keV gamma spectrum with 2.2% energy resolution is reviewed as a case study of RTSD research and development.

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Publication Details

Journal
Advanced Functional Materials
Published
2025-05-20
DOI
https://doi.org/10.1002/adfm.202505486
Primary Topic
Advanced Semiconductor Detectors and Materials
Type
article
Field-Weighted Citation Impact
0.00

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article

Back to Basics: Energy Resolution of Room Temperature Semiconductor Detectors Through the Lens of BiI 3

Juan C. Nino
Advanced Functional Materials
Advanced Semiconductor Detectors and Materials
article

Back to Basics: Energy Resolution of Room Temperature Semiconductor Detectors Through the Lens of BiI 3

Juan C. Nino
article en

Abstract

Abstract The energy resolution of the prototype spectrometer is one of the most cited figures when reporting the development of new promising room‐temperature semiconductor detectors (RTSDs) for gamma‐ray spectroscopy. As the search for new materials has expanded beyond the traditional nuclear field, it is important to recall best practices on how to characterize the energy resolution of a detector so that it can be properly compared with previously reported data in the literature and more effectively advance the field forward. Here, as part of this special edition, the path toward reporting comparable energy resolution is presented through the case study of BiI 3 . Notwithstanding the essential optimization of single crystal growth, and detector manufacturing processes, as well as the fine‐tuning of detector electronics required for taking a promising material into a deployable detector, the evolution that took BiI 3 single crystals detectors from barely able to collect a 241 Am alpha spectrum to a first‐ever 241 Am gamma spectrum, and eventually to demonstrate a 137 Cs 662 keV gamma spectrum with 2.2% energy resolution is reviewed as a case study of RTSD research and development.

Advanced Functional MaterialsVol. 36(21)
University of Florida (US)
U.S. Department of Energy, Defense Threat Reduction Agency, National Nuclear Security Administration
Openalex Percentile: Top 91%
Advanced Semiconductor Detectors and Materials
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Back to Basics: Energy Resolution of Room Temperature Semiconductor Detectors Through the Lens of BiI <sub>3</sub> — Juan C. Nino · Advanced Functional Materials (2025) | TGRS Research Map | TGRS