Reliability of CaZrO ₃ and MgO capacitors at high temperatures

Abstract Calcium zirconate and magnesium oxide have both been found to have useful dielectric properties at high temperatures. Multilayer ceramic capacitors (MLCCs) were made with these dielectrics and platinum electrodes. The relationship between the lifespan (mean‐time to failure) and applied voltage was determined using Weibull statistics. CaZrO 3 capacitors were tested between 550°C and 600°C while MgO capacitors were tested between 600°C and 650°C. The temperature coefficient E a and the voltage coefficient n of the Prokopowicz–Vaskas equation were determined under various test conditions. Activation energies for calcium zirconate and magnesium oxide were 3.25 eV and 3.48 eV, respectively. Resistance degradation of CaZrO 3 and MgO capacitors, tested at 600°C and 250 V, were compared.