Surface Defect and Malformation Characteristics Detection for Fresh Sweet Cherries Based on YOLOv8-DCPF Method

The damaged and deformed fruits of fresh berries severely restrict the economic value of produce, and accurate identification and grading methods have become a global research hotspot. To address the challenges of rapid and accurate defect detection in intelligent cherry sorting systems, this study proposes an enhanced YOLOv8n-based framework for sweet cherry defect identification. First, the dilation-wise residual (DWR) module replaces the conventional C2f structure, allowing for the adaptive capture of both local and global features through multi-scale convolution. This enhances the recognition accuracy of subtle surface defects and large-scale damages on cherries. Second, a channel attention feature fusion mechanism (CAFM) is incorporated at the front end of the detection head, which enhances the model’s ability to identify fine defects on the cherry surface. Additionally, to improve bounding box regression accuracy, powerful-IoU (PIoU) replaces the traditional CIoU loss function. Finally, self-distillation technology is introduced to further improve the mode’s generalization capability and detection accuracy through knowledge transfer. Experimental results show that the YOLOv8-DCPF model achieves precision, mAP, recall, and F1 score rates of 92.6%, 91.2%, 89.4%, and 89.0%, respectively, representing improvements of 6.9%, 5.6%, 6.1%, and 5.0% over the original YOLOv8n baseline network. The proposed model demonstrates high accuracy in cherry defect detection, providing an efficient and precise solution for intelligent cherry sorting in agricultural engineering applications.