Machine-Learning-Algorithm-Assisted Portable Miniaturized NIR Spectrometer for Rapid Evaluation of Wheat Flour Processing Applicability

In this investigation, we established an intelligent computational framework comprising a novel starfish-optimization-algorithm-optimized support vector regression (SOA-SVR) model and a multi-algorithm joint strategy to evaluate the processing applicability of wheat flour in terms of sedimentation value (SV) and falling number (FN) using near-infrared (NIR) data (900-1700 nm) obtained using a miniaturized NIR spectrometer. By employing an improved whale optimization algorithm (iWOA) coupled with a successive projections algorithm (SPA), we selected the 20 most informative wavelengths (MIWs) from the full range spectra, allowing the iWOA/SPA-SOA-SVR model to predict SV with correlation coefficient and root-mean-square errors in prediction (R_P and RMSE_P) of 0.9605 and 0.2681 mL. Additionally, RFE, in combination with the iWOA, identified 30 MIWs and enabled the RFE/iWOA-SOA-SVR model to predict the FN with an R_P and RMSE_P of 0.9224 and 0.3615 s. The robustness and reliability of the two SOA-SVR models were further validated using 50 independent samples per index, a statistical two-sample F-test, and a <i>t</i>-test. In conclusion, the combination of a portable miniaturized NIR spectrometer and an SOA-driven SVR algorithm demonstrated technical feasibility in quantifying the SV and FN of wheat flour, thus providing a novel strategy for the on-site assessment of wheat flour processing applicability.