Extracting optimal features from switch current curve using random forest

This paper proposes a feature selection method based on random forest to address the issues of high dimensionality and redundant features in switch data. Firstly, multidimensional features including average, maximum, minimum, gradient, etc. were extracted based on the S700K switch current curve; Subsequently, the random forest algorithm is used to evaluate the importance of each feature and select the optimal feature subset. This method provides high-quality feature inputs for the construction of subsequent fault diagnosis models, laying the foundation for optimizing model performance[1].

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Publication Details

Published
2025-05-19
DOI
https://doi.org/10.1117/12.3068591
Primary Topic
VLSI and Analog Circuit Testing
Type
article
Field-Weighted Citation Impact
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article

Extracting optimal features from switch current curve using random forest

Chao Du, Xiaoyun Sun, Yong Chen
VLSI and Analog Circuit Testing
article

Extracting optimal features from switch current curve using random forest

Chao Du, Xiaoyun Sun, Yong Chen
article en

Abstract

This paper proposes a feature selection method based on random forest to address the issues of high dimensionality and redundant features in switch data. Firstly, multidimensional features including average, maximum, minimum, gradient, etc. were extracted based on the S700K switch current curve; Subsequently, the random forest algorithm is used to evaluate the importance of each feature and select the optimal feature subset. This method provides high-quality feature inputs for the construction of subsequent fault diagnosis models, laying the foundation for optimizing model performance[1].

Shijiazhuang Tiedao University (CN)
Life in Land
Openalex Percentile: Top 91%
VLSI and Analog Circuit Testing
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