A 54μW Design-Agnostic Clock, Voltage, and EM-Pulse Fault-Injection Attack Detection Using Time-to-Voltage Conversion

Fault Injection Attacks (FIAs) exploit faults to reveal sensitive information or extract keys from secured crypto algorithms (e.g. AES, Kyber, ASCON) [1]–[5]. Clock, voltage, and EM pulse (EMP) based FIAs are widespread due to the availability of cheap attack hardware [4]. Such glitches exploit digital designs by creating timing failures in the data path, leading to bit-flips, stuck-at-faults, etc. [3], [4] (Fig. 1), which are exploited using algorithms such as Differential Faults Attacks [6]. In recent years, a few FIA detector ASICs have emerged, including design-specific attack detectors [7] and design-agnostic detectors[8], [9]. [7] implements an error-checking-based FIA detector for AES with a 40% area overhead. Oversampling the clock to detect glitches[8] restricts timing sensitivity and consumes high power and area (0.8mW, 4800μm2 in 5nm). [9] utilizes a delay-locked-loop (DLL) to determine the duty cycle deviation in the presence of clock glitches, consuming 300μW at 50MHz. Though [8], [9] did not include a crypto core, the power consumption of the clock-glitch detector is >50-200% of a typical crypto core (e.g. AES 256 65nm 50MHz is 590μW[10]), calling for an order-of-magnitude improvement in the power of FIA detectors. Moreover, there have been no dedicated voltage or EM Pulse glitch detector ASICs. Relying on a clock-glitch detector for voltage glitch detection, as in [9], may miss a voltage/EM Pulse glitch that creates a fault in the data path but not a clock glitch, causing true negatives.

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Published
2025-04-13
DOI
https://doi.org/10.1109/cicc63670.2025.10983804
Primary Topic
Smart Grid Security and Resilience
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article
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article

A 54μW Design-Agnostic Clock, Voltage, and EM-Pulse Fault-Injection Attack Detection Using Time-to-Voltage Conversion

Shreyas Sen, Archisman Ghosh, Yudhajit Ray, Sarthak Antal
Smart Grid Security and Resilience
article

A 54μW Design-Agnostic Clock, Voltage, and EM-Pulse Fault-Injection Attack Detection Using Time-to-Voltage Conversion

Shreyas Sen, Archisman Ghosh, Yudhajit Ray, Sarthak Antal
article en

Abstract

Fault Injection Attacks (FIAs) exploit faults to reveal sensitive information or extract keys from secured crypto algorithms (e.g. AES, Kyber, ASCON) [1]–[5]. Clock, voltage, and EM pulse (EMP) based FIAs are widespread due to the availability of cheap attack hardware [4]. Such glitches exploit digital designs by creating timing failures in the data path, leading to bit-flips, stuck-at-faults, etc. [3], [4] (Fig. 1), which are exploited using algorithms such as Differential Faults Attacks [6]. In recent years, a few FIA detector ASICs have emerged, including design-specific attack detectors [7] and design-agnostic detectors[8], [9]. [7] implements an error-checking-based FIA detector for AES with a 40% area overhead. Oversampling the clock to detect glitches[8] restricts timing sensitivity and consumes high power and area (0.8mW, 4800μm2 in 5nm). [9] utilizes a delay-locked-loop (DLL) to determine the duty cycle deviation in the presence of clock glitches, consuming 300μW at 50MHz. Though [8], [9] did not include a crypto core, the power consumption of the clock-glitch detector is >50-200% of a typical crypto core (e.g. AES 256 65nm 50MHz is 590μW[10]), calling for an order-of-magnitude improvement in the power of FIA detectors. Moreover, there have been no dedicated voltage or EM Pulse glitch detector ASICs. Relying on a clock-glitch detector for voltage glitch detection, as in [9], may miss a voltage/EM Pulse glitch that creates a fault in the data path but not a clock glitch, causing true negatives.

Purdue University West Lafayette (US)
Openalex Percentile: Top 88%
Smart Grid Security and Resilience
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