An Improved Algorithm Based on March C- for Anti-Radiation SRAM

Design for test (DFT) of memory is crucial for ensuring the test quality of chips. Memory build-in self test (MBIST) is a widely in used memory testing. The key to MBIST lies in the selection of the test algorithm. March algorithm is the most widely used and efficient method for MBIST. In this paper, an improved March C- algorithm is proposed to strengthen the detection ability of write disturb faults (WDF) and deceptive read disturb faults (DRDF). By optimizing a specific sequence of operations within the traditional March C- algorithm, the improved algorithm is able to efficiently detect these faults while maintaining low time complexity. A MBIST circuit based on the improved algorithm has been designed, and functional simulation has been completed using VCS. Simulation results indicate that the improved algorithm executes correctly and successfully detects the injected WDF and DRDF faults. Compared to the March SS algorithm, the improved algorithm has lower time complexity while covering WDF and DRDF. Compared to the March B algorithm, the improved algorithm not only has lower time complexity but also enhances the detection of fault types.