Modeling Uncertainty in Deep Learning for Focus Prediction of Defocused Images

Autofocus is a critical component in automatic digital microscopy, directly impacting imaging precision and operational efficiency. To accelerate focusing processes, deep learning methods are increasingly utilized for single-frame focus prediction. However, conventional networks often assume their predictions are accurate across all sample types, which risks undetected errors when handling novel or heterogeneous samples. This paper introduces a Bayesian convolutional neural network specifically designed to predict defocus distance from single images while simultaneously generating uncertainty estimates for these predictions. Leveraging these uncertainty estimates, our method dynamically assesses and filters the reliability of the focus predictions, ensuring robust performance across variable sample types. Through comprehensive experiments on diverse specimens, including pathological tissue sections and printed circuit board inspections, our approach demonstrates superior prediction accuracy and efficiency compared to traditional data-driven methods and sharpness quantification functions. Furthermore, the uncertainty estimation effectively flags unreliable predictions, substantially enhancing autofocus reliability. Based on this uncertainty framework, we additionally propose an innovative focal plane alignment strategy, further advancing the system's applicability in complex imaging environments.

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Publication Details

Journal
Journal of Lightwave Technology
Published
2025-05-19
DOI
https://doi.org/10.1109/jlt.2025.3571337
Primary Topic
Image Processing Techniques and Applications
Type
article
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article

Modeling Uncertainty in Deep Learning for Focus Prediction of Defocused Images

Ping Zhong, Xin Tang, Jingfeng Zhu, Xinli Zheng et al.
Journal of Lightwave Technology
Image Processing Techniques and Applications
article

Modeling Uncertainty in Deep Learning for Focus Prediction of Defocused Images

Ping Zhong, Xin Tang, Jingfeng Zhu, Xinli Zheng, Jie Chen, Jiancheng Qi, Yong Kong, Zhuoyue Li, Keke Liu
article en

Abstract

Autofocus is a critical component in automatic digital microscopy, directly impacting imaging precision and operational efficiency. To accelerate focusing processes, deep learning methods are increasingly utilized for single-frame focus prediction. However, conventional networks often assume their predictions are accurate across all sample types, which risks undetected errors when handling novel or heterogeneous samples. This paper introduces a Bayesian convolutional neural network specifically designed to predict defocus distance from single images while simultaneously generating uncertainty estimates for these predictions. Leveraging these uncertainty estimates, our method dynamically assesses and filters the reliability of the focus predictions, ensuring robust performance across variable sample types. Through comprehensive experiments on diverse specimens, including pathological tissue sections and printed circuit board inspections, our approach demonstrates superior prediction accuracy and efficiency compared to traditional data-driven methods and sharpness quantification functions. Furthermore, the uncertainty estimation effectively flags unreliable predictions, substantially enhancing autofocus reliability. Based on this uncertainty framework, we additionally propose an innovative focal plane alignment strategy, further advancing the system's applicability in complex imaging environments.

Journal of Lightwave TechnologyVol. 43(15)
Shanghai University of Engineering Science (CN), University of Shanghai for Science and Technology (CN), Donghua University (CN)
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Openalex Percentile: Top 85%
Image Processing Techniques and Applications
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