Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources

Nanoradian precision has been achieved in control of X-ray optics using feedback from optical interferometric measurements and real time adjustments of three mirrors in a simulated X-ray laser cavity in recent work reported by Koehlenbeck et al.

Authors

Ting Guo
J. Lien (ORCID: https://orcid.org/0000-0002-0425-9138)

Publication Details

Journal: Light Advanced Manufacturing
Published: 2025-01-01
DOI: https://doi.org/10.37188/lam.2025.038
Primary Topic: Advanced X-ray Imaging Techniques
Type: article
Field-Weighted Citation Impact: 0.00

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article

Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources

Ting Guo, J. Lien

Jan 1, 2025

Light Advanced Manufacturing

Advanced X-ray Imaging Techniques

article

Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources

Ting Guo, J. Lien

January 1, 2025article en

Abstract

Light Advanced ManufacturingVol. 6(2)

Affordable and clean energy

Openalex Percentile: Top 87%

Advanced X-ray Imaging Techniques

DOI Open Access PDF OpenAlex

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Precision motion control of X-ray optics assisted with optical interferometric metrology for advanced X-ray beam sources — Ting Guo, J. Lien · Light Advanced Manufacturing (2025) | TGRS Research Map | TGRS