Research on error analysis and correction of intensity modulation spectral polarization technology

Polarization spectral intensity modulation technology can achieve all stokes parameters of the target and has broad application prospects in fields such as space detection. At present, the research of scholars on this system mainly focuses on the spectral modulation module, without considering the influence of the spectrometer module on the polarization performance of the incident light, which restricts its realization of high precision and quantification. The research on error analysis and correction methods is one of the key factors to ensure the measurement accuracy of intensity modulated spectral polarization technology. In response to the above problems, first of all, we established a spectral polarization modulation and demodulation model theoretically. Then, on the premise that all the pre-spectral modulation modules are in an ideal state, the influences of the spectral bandwidth, noise and nonlinear effects of the spectrometer itself on the reconstruction accuracy of stokes parameters were analyzed. The analysis results show that the spectral bandwidth of the spectrometer is the most sensitive to the error generated by the reconstruction of Stokes parameters. Finally, in view of the above error factors, multiple correction algorithms are studied to improve the reconstruction accuracy of stokes parameters in spectral polarization technology. The improvement effects of different correction algorithms on the polarization measurement accuracy are compared and the optimal algorithm is identified. This research provides a theoretical basis for the subsequent development of spectral polarization instruments and the later data processing.

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Published
2025-05-16
DOI
https://doi.org/10.1117/12.3071096
Primary Topic
Optical Systems and Laser Technology
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Research on error analysis and correction of intensity modulation spectral polarization technology

Han Lin, Xiang Guangfeng, Sicheng Liang
Optical Systems and Laser Technology
article

Research on error analysis and correction of intensity modulation spectral polarization technology

Han Lin, Xiang Guangfeng, Sicheng Liang
article en

Abstract

Polarization spectral intensity modulation technology can achieve all stokes parameters of the target and has broad application prospects in fields such as space detection. At present, the research of scholars on this system mainly focuses on the spectral modulation module, without considering the influence of the spectrometer module on the polarization performance of the incident light, which restricts its realization of high precision and quantification. The research on error analysis and correction methods is one of the key factors to ensure the measurement accuracy of intensity modulated spectral polarization technology. In response to the above problems, first of all, we established a spectral polarization modulation and demodulation model theoretically. Then, on the premise that all the pre-spectral modulation modules are in an ideal state, the influences of the spectral bandwidth, noise and nonlinear effects of the spectrometer itself on the reconstruction accuracy of stokes parameters were analyzed. The analysis results show that the spectral bandwidth of the spectrometer is the most sensitive to the error generated by the reconstruction of Stokes parameters. Finally, in view of the above error factors, multiple correction algorithms are studied to improve the reconstruction accuracy of stokes parameters in spectral polarization technology. The improvement effects of different correction algorithms on the polarization measurement accuracy are compared and the optimal algorithm is identified. This research provides a theoretical basis for the subsequent development of spectral polarization instruments and the later data processing.

Chinese Academy of Sciences (CN), Hefei Institutes of Physical Science (CN)
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Optical Systems and Laser Technology
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Research on error analysis and correction of intensity modulation spectral polarization technology — Han Lin, Xiang Guangfeng, et al. · (2025) | TGRS Research Map | TGRS