Comprehensive Study of Thermal Neutron SER in Bulk-Planar, Bulk-FinFET, FDSOI-Planar, and Bulk-GAA Technology, Evaluated at HANARO
In this study, we evaluated thermal-neutron soft error rate (thnSER) at HANARO in 42 circuits across 10 technologies (130 nm to 3 nm) including bulk-planar, FDSOI-planar, bulk-FinFET, and bulk-GAA, and discusses two aspects: the feasibility of HANARO for evaluating thnSER, and the trend of thnSER.
Authors
- Jongyul Kim (ORCID: https://orcid.org/0000-0002-6877-0189)
- Taiki Uemura
- Sung‐Soo Kim (ORCID: https://orcid.org/0000-0001-8969-7075)
- Jong‐Ho Lee (ORCID: https://orcid.org/0000-0003-3559-9802)
- Shinyoung Chung
Institutions
- Korea Atomic Energy Research Institute (KR)
- Samsung (South Korea) (KR)
Publication Details
- Published
- 2025-03-30
- DOI
- https://doi.org/10.1109/irps48204.2025.10982838
- Primary Topic
- Nuclear Physics and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00