Optical Reliability and Reliability of Optical Devices

We report on the reliability aspects of optical elements in optical devices. Based on a broad range of field application profiles, we focus on evaluation of potential failure mechanisms and propose an assessment methodology. The primary components in optical systems are beam-transmitting and reflective layers, characterized by essential parameters of transmission and reflectivity. The generation of optical performance losses is due to the presence of intrinsic and extrinsic degradation mechanisms, light absorbing and scattering defect sites in sub-layers. These defects can be provoked by controlled imprinting via indentation, enabling aging testing. The novel characterization methods enable a comprehensive reliability assessment of optical devices, specifically on optical reliability, intended as the impact on optical parameters due to external stimuli, including thermal impact, environmental influence, and optical radiation. The methodology described serves as a guidance for the evaluation of system optical robustness, definition of testing protocols, and for qualification of optical devices.

Authors

Institutions

Publication Details

Published
2025-03-30
DOI
https://doi.org/10.1109/irps48204.2025.10983183
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.00
Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

Optical Reliability and Reliability of Optical Devices

D. Meinhold, Andreas Martin, Aleksandr Baklanov, Sebastian Pregl et al.
1 links
Integrated Circuits and Semiconductor Failure Analysis
article

Optical Reliability and Reliability of Optical Devices

D. Meinhold, Andreas Martin, Aleksandr Baklanov, Sebastian Pregl, Annalisa Cappellani
article en

Abstract

We report on the reliability aspects of optical elements in optical devices. Based on a broad range of field application profiles, we focus on evaluation of potential failure mechanisms and propose an assessment methodology. The primary components in optical systems are beam-transmitting and reflective layers, characterized by essential parameters of transmission and reflectivity. The generation of optical performance losses is due to the presence of intrinsic and extrinsic degradation mechanisms, light absorbing and scattering defect sites in sub-layers. These defects can be provoked by controlled imprinting via indentation, enabling aging testing. The novel characterization methods enable a comprehensive reliability assessment of optical devices, specifically on optical reliability, intended as the impact on optical parameters due to external stimuli, including thermal impact, environmental influence, and optical radiation. The methodology described serves as a guidance for the evaluation of system optical robustness, definition of testing protocols, and for qualification of optical devices.

Infineon Technologies (Germany) (DE)
Affordable and clean energy
Openalex Percentile: Top 91%
Integrated Circuits and Semiconductor Failure Analysis
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.