Optical Reliability and Reliability of Optical Devices
We report on the reliability aspects of optical elements in optical devices. Based on a broad range of field application profiles, we focus on evaluation of potential failure mechanisms and propose an assessment methodology. The primary components in optical systems are beam-transmitting and reflective layers, characterized by essential parameters of transmission and reflectivity. The generation of optical performance losses is due to the presence of intrinsic and extrinsic degradation mechanisms, light absorbing and scattering defect sites in sub-layers. These defects can be provoked by controlled imprinting via indentation, enabling aging testing. The novel characterization methods enable a comprehensive reliability assessment of optical devices, specifically on optical reliability, intended as the impact on optical parameters due to external stimuli, including thermal impact, environmental influence, and optical radiation. The methodology described serves as a guidance for the evaluation of system optical robustness, definition of testing protocols, and for qualification of optical devices.
Authors
- D. Meinhold
- Andreas Martin (ORCID: https://orcid.org/0000-0002-7884-8867)
- Aleksandr Baklanov
- Sebastian Pregl
- Annalisa Cappellani
Institutions
- Infineon Technologies (Germany) (DE)
Publication Details
- Published
- 2025-03-30
- DOI
- https://doi.org/10.1109/irps48204.2025.10983183
- Primary Topic
- Integrated Circuits and Semiconductor Failure Analysis
- Type
- article
- Field-Weighted Citation Impact
- 0.00