Electromigration Assessment in Power Grids with Account of Non-Uniform Temperature Distribution
Validation of recently proposed methodology of electromigration (EM) assessment in power networks was achieved by fitting to measurements performed on dedicated test-structures when non-uniform temperature distribution generated by specially designed on-chip heaters and interconnect Joule heating was accounted. Analysis of the predicted by simulation voiding locations confirms the essential impact of temperature non-uniformity on EM-induced IR drop degradation in the power/ground grid. Accurate tuning the major EM model parameters allowed to achieve a good fit between model predictions and measurements for different test-grid structures.
Authors
- Valeriy Sukharev (ORCID: https://orcid.org/0000-0002-5647-0584)
- Armen Kteyan (ORCID: https://orcid.org/0000-0002-8743-0155)
- S. Moreau (ORCID: https://orcid.org/0000-0001-6104-2050)
- Yong Hyeon Yi (ORCID: https://orcid.org/0000-0001-6834-000X)
- C. Kim
- Richard W. Bloom (ORCID: https://orcid.org/0000-0002-4208-5685)
- Jun-Ho Choy (ORCID: https://orcid.org/0000-0002-8977-5720)
Institutions
- University of Minnesota (US)
- Commissariat à l'Énergie Atomique et aux Énergies Alternatives (FR)
- Siemens (United States) (US)
- Laboratoire d'Électronique des Technologies de l'Information (FR)
- Université Grenoble Alpes (FR)
Publication Details
- Published
- 2025-03-30
- DOI
- https://doi.org/10.1109/irps48204.2025.10983140
- Primary Topic
- Power Transformer Diagnostics and Insulation
- Type
- article
- Field-Weighted Citation Impact
- 0.00