A Novel De-Embedding Method of Electric and Magnetic Probes

The paper proposes a novel extraction method of induced signal for both electric and magnetic probes, in order to remove the ripples in probe’s original output signal. The ripples are caused by impedance discontinuities and multi-reflections of the probe. Using a time-domain approach, the proposed method extracts the S-parameters of the probe’s transmission network by only one-time measurement. Then these S-parameters are used to move the measurement plane from the probe output port to its tip’s loop/monopole/dipole. The proposed method effectively removes ripples in the probe output voltage and make the probe calibration easier. Verification is conducted through simulations and practical experiments, demonstrating significant ripples reduction and improved reliability of the probe.