Exploring AC Time-Dependent Dielectric Breakdown (TDDB) Through Frequency Noise Analysis

This study focuses on AC Time-Dependent Dielectric Breakdown (TDDB) testing optimization to closely emulate realworld circuit operations and physical insight on DC-to-AC benefit. We propose an optimized AC TDDB testing flow to minimize measurement interference, resulting in an accurate DCto-AC gain. Through simulations and low-frequency noise measurements, we uncover the slower percolation growth in HK for AC TDDB due to less neighboring trap generation. The findings underscore the importance of optimized testing methodologies, accurate characterization in AC TDDB performance and device reliability, offering a deeper insight for design for reliability and technology advancements.