Methodology for Parasitic Elements Extraction of SiC Power Module Based on N-Port Measurement
This paper presents a measurement-based methodology focused on the parasitic extraction of RL elements involved in the commutation power loop of SiC-based power modules. It can be seen as a black/grey-box model that considers a set of Scattering-parameters (S-Parameters) measurements for a given number of ports (N) externally available in a power module under test. The proposed approach allows us to build, in some hours, a model intended to be a behavior representation as close as possible to the physics of the power module. Uncertainties and errors of measurement are managed by optimization regression algorithm based on least-square using the Gauss-Newton-Raphson (GNR) method. Experimental results using a SiC-based power module with different samples are presented for validation purposes.
Authors
- Sébastien Serpaud (ORCID: https://orcid.org/0000-0002-6805-6276)
- Victor D. N. Santos (ORCID: https://orcid.org/0000-0002-5441-4394)
- Bernardo Cougo
- Gregory Arthur de Almeida Carlos (ORCID: https://orcid.org/0000-0002-7012-3538)
- Fabio Coccetti
Institutions
- IRT M2P (FR)
- Safran (France) (FR)
Publication Details
- Journal
- IEEE Transactions on Power Electronics
- Published
- 2025-05-15
- DOI
- https://doi.org/10.1109/tpel.2025.3570619
- Citations
- 2
- Primary Topic
- Silicon Carbide Semiconductor Technologies
- Type
- article
- Field-Weighted Citation Impact
- 1.46