Evaluation with FEM analysis of peak case non-rupture current for power devices working at very high current

In this work, a Finite Element (FE) thermal model is presented to further understand the mechanism of surge current-induced failure of press-pack devices. The model is set up with the results of electrical measurements and high-framerate video acquisition taken during diode tests to identify the surge current at which the failure occurs. The tests were carried out with an ad hoc bench specifically designed to have surge currents with different energies to be dissipated in the diode under test using the Integral Resonant Sliding Mode Control (IRSMC) technique.

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Publication Details

Journal
Microelectronics Reliability
Published
2025-05-15
DOI
https://doi.org/10.1016/j.microrel.2025.115787
Primary Topic
Electrical Fault Detection and Protection
Type
article
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article

Evaluation with FEM analysis of peak case non-rupture current for power devices working at very high current

Davide Spaggiari, Federico Portesine, N. Delmonte, P. Cova et al.
Microelectronics Reliability
Electrical Fault Detection and Protection
article

Evaluation with FEM analysis of peak case non-rupture current for power devices working at very high current

Davide Spaggiari, Federico Portesine, N. Delmonte, P. Cova, M. Aschero
article en

Abstract

In this work, a Finite Element (FE) thermal model is presented to further understand the mechanism of surge current-induced failure of press-pack devices. The model is set up with the results of electrical measurements and high-framerate video acquisition taken during diode tests to identify the surge current at which the failure occurs. The tests were carried out with an ad hoc bench specifically designed to have surge currents with different energies to be dissipated in the diode under test using the Integral Resonant Sliding Mode Control (IRSMC) technique.

Microelectronics ReliabilityVol. 171
University of Parma (IT)
Gender equality
Openalex Percentile: Top 91%
Electrical Fault Detection and Protection
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Evaluation with FEM analysis of peak case non-rupture current for power devices working at very high current — Davide Spaggiari, Federico Portesine, et al. · Microelectronics Reliability (2025) | TGRS Research Map | TGRS