Structural inversion asymmetry in epitaxial ultrathin films of Bi(111)/InSb(111)B

Bismuth (Bi) films hold potential for spintronic devices due to strong spin-orbit coupling. Understanding the growth, surface states, and interactions with the substrate is key to their functionalization. Large-area high-quality (111) Bi ultrathin films were grown on InSb (111)B substrates by molecular beam epitaxy (MBE). Strong film-substrate interactions epitaxially stabilize the (111) orientation and lead to nonequivalent interface potentials. Analysis of angle-resolved photoemission spectroscopy (ARPES) measurements, employed to characterize the evolution of the surface states with film thickness, indicate a crossing at the $\overline{M}$ point, suggesting a topologically trivial phase in the thin film. The results show the presence of interfacial bonds to the substrate breaks inversion symmetry, preventing the semimetal-to-semiconductor transition predicted for freestanding bismuth layers, highlighting the importance of controlled functionalization and surface passivation of two-dimensional materials.

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Publication Details

Journal
Physical Review Materials
Published
2025-05-14
DOI
https://doi.org/10.1103/physrevmaterials.9.054202
Citations
4
Primary Topic
Topological Materials and Phenomena
Type
article
Field-Weighted Citation Impact
4.99

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article

Structural inversion asymmetry in epitaxial ultrathin films of Bi(111)/InSb(111)B

Anderson Janotti, Aaron N. Engel, Shinichi Nishihaya, Hadass S. Inbar et al.
4 citations
Physical Review Materials
Topological Materials and Phenomena
4.99
article

Structural inversion asymmetry in epitaxial ultrathin films of Bi(111)/InSb(111)B

Anderson Janotti, Aaron N. Engel, Shinichi Nishihaya, Hadass S. Inbar, Connor P. Dempsey, C. J. Palmstrøm, Yu Hao Chang, Jason T. Dong, S. Khalid, А. В. Федоров, Muhammad Zubair
article en
4 citations

Abstract

Bismuth (Bi) films hold potential for spintronic devices due to strong spin-orbit coupling. Understanding the growth, surface states, and interactions with the substrate is key to their functionalization. Large-area high-quality (111) Bi ultrathin films were grown on InSb (111)B substrates by molecular beam epitaxy (MBE). Strong film-substrate interactions epitaxially stabilize the (111) orientation and lead to nonequivalent interface potentials. Analysis of angle-resolved photoemission spectroscopy (ARPES) measurements, employed to characterize the evolution of the surface states with film thickness, indicate a crossing at the $\overline{M}$ point, suggesting a topologically trivial phase in the thin film. The results show the presence of interfacial bonds to the substrate breaks inversion symmetry, preventing the semimetal-to-semiconductor transition predicted for freestanding bismuth layers, highlighting the importance of controlled functionalization and surface passivation of two-dimensional materials.

Physical Review MaterialsVol. 9(5)
University of California, Santa Barbara (US), Princeton Plasma Physics Laboratory (US), Advanced Light Source, University of Delaware (US)
National Science Foundation, U.S. Department of Energy, National Energy Research Scientific Computing Center, Materials Research Science and Engineering Center, Harvard University, Laboratory Directed Research and Development
Openalex Percentile: Top 5%
Topological Materials and Phenomena
4.99
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