Frequency Selective Gain and Distortion Analysis with Standard Compliant Test Signals

We present a simplified method to extract the frequency dependent gain from wideband modulated signals. Based on our wideband vector measurement system, the method is used to extract the complex linear gain for the large signal operation point of complex non-linear devices for modern communication systems. It allows the characterization of noise and non-linear distortion from a single, dense modulation signal – without adding further complexity to the signal generation procedures. The experimental results show very good alignment with classic multisine measurements within 0.1dB gain error. The main benefits of using a single realization are the flexibility in utilizing real application signals, reduction in measurement time and memory by a factor of 10, and better control of the DUTs large signal operating point.