Artificial Material Parameter Analysis Using a Realistic Model of the Transmission Reflection Method

Material characterization is an integral part of many applications in electrical engineering and other fields, such as medicine or biotechnology. One possible implementation is the transmission reflection method, which is used to determine both the real and imaginary part of a material sample with high precision. In this work, a simulation model based on the transmission reflection method is derived from real measurement data in a free-space setup for material characterization. The model is used to generate realistic scattering parameters of artificial materials with selected dielectric properties and thicknesses in the frequency range from 70-170 GHz. These are subsequently characterized and the permissible material parameters are determined.