Diverse Machine Learning-Based Malicious Detection for Industrial Control System
The digital transformation of manufacturing through OT, IoT, and AI integration has created extensive networked sensor ecosystems, introducing critical cybersecurity vulnerabilities at IT-OT interfaces. This might particularly challenge the detection component of the NIST cybersecurity framework. To address this concern, the authors designed a diverse machine learning-based intrusion detection system framework for industrial control systems (DICS). DICS implements a sophisticated dual-module architecture. The screening analysis module initially categorizes network traffic as either unidentifiable or recognized packets, while the classification analysis module subsequently determines specific attack types for identifiable traffic. When unrecognized zero-day attack traffic accumulates in a buffer and reaches a predetermined threshold, the agile training module incorporates these patterns into the system, which enables continuous adaptation. During experimental validation, the authors rigorously assess dataset industrial relevance and strategically divide the datasets into four distinct groups to accurately simulate diverse network traffic patterns characteristic of real industrial environments. Moreover, the authors highlight the system’s alignment with IEC 62443 requirements for industrial control system security. In conclusion, the comprehensive analysis demonstrates that DICS delivers superior detection capabilities for malicious network traffic in industrial settings.
Authors
- Jung-San Lee (ORCID: https://orcid.org/0000-0001-7030-2985)
- Tzu‐Wei Lin (ORCID: https://orcid.org/0000-0002-3115-9386)
- Ying-Chin Chen
- Chia‐Hao Cheng
Institutions
- Institute for Information Industry (TW)
- Feng Chia University (TW)
Publication Details
- Journal
- Electronics
- Published
- 2025-05-10
- DOI
- https://doi.org/10.3390/electronics14101947
- Primary Topic
- Anomaly Detection Techniques and Applications
- Type
- article
- Field-Weighted Citation Impact
- 0.00