Crop Yield Prediction using Advanced Deep Learning Techniques
Crop yield prediction is an essential tool of agricultural planning to ensure food and resource management efficiency. Traditional crop yield models are statistical with a basis on weather patterns, but such limitations prevail because the approach does not account for complicated nonlinear interdependencies between different variables and factors. It is with the growth of machine learning and its subset deep learning that the accuracy of predictions has increased significantly. This paper explores the application of advanced deep learning techniques for crop yield prediction, reviewing the current state of the art and identifying future research opportunities. By utilizing large-scale datasets, remote sensing technologies, and deep neural networks, we are demonstrating how these methods can better realize such goals of accurate, scalable, and sustainable predictions.
Authors
- V. Asha (ORCID: https://orcid.org/0009-0007-6406-3958)
- M. Govindaraj (ORCID: https://orcid.org/0000-0001-7568-6658)
- A. Bhanu Prasad
- Kapopara Harsha Maheshbhai
- KT Dinesha
Publication Details
- Published
- 2025-03-19
- DOI
- https://doi.org/10.1109/iciccs65191.2025.10984681
- Primary Topic
- Smart Agriculture and AI
- Type
- article
- Field-Weighted Citation Impact
- 0.00