A Fast Algorithm for the Near-Field Radiation Assessment of Interconnects

In this contribution, we investigate the radiated emission of interconnect structures in the context of electromagnetic compatibility assessment. Through the expansion of the integral operators and radiation patterns into spherical harmonics, an efficient and fast approach is derived to compute induced voltages at the receiver. The novel algorithm is applied to a microstrip interconnect with and without defective ground structure. A comparison to a full-wave solver and measurements verify the accuracy of the proposed method and showcase a speed-up with a factor 3000 as compared to the commercial solver.