Computationally Efficient System-Level Modeling for Open-Loop Bulk Current Injection (BCI) Testing

The Bulk Current Injection (BCI) testing standard (ISO11452-4) evaluates the immunity of a device under test (DUT) and its associated wiring harness to disturbances induced by electromagnetic fields. The standard outlines two test methods: substitution (open-loop) and current monitoring (closed-loop) probe methods. In a previous publication, the authors demonstrated a reliable BCI closed-loop system-level modeling methodology that closely matched laboratory measurements. In the present work, an enhanced modeling scheme has been developed to address the computational complexity of the open-loop immunity testing method. This improved approach combines coupled transient system-level circuit techniques with electromagnetic analysis. The reliability of this enhanced predictive modeling scheme for BCI characterization has been validated through silicon measurements on a battery management integrated circuit device. The results demonstrate strong agreement between simulated and measured IC pin voltages, confirming the reliability and robustness of the enhanced modeling scheme for BCI characterization.