Sectional imaging using structured detection under computational optical scanning holographic microscopy

Computational optical scanning holography (COSH) is a single-pixel imaging technique that can provide holograms with a simple common-path optical setup. Although COSH can reconstruct three-dimensional (3D) objects through phase-shifting and optical backpropagation, there are defocus artifacts in reconstructed images from different axial positions, which leads to lower axial resolution. In this paper, a structured detection technique in COSH is proposed to improve the axial resolution of COSH by reducing defocus artifacts. The proposed method can improve the axial resolution with optical sectioning by structured illumination microscopy (OS-SIM) principles. In addition, the proposed method is applied to microscopy. The feasibility of the proposed method is experimentally verified.

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Publication Details

Journal
Optics & Laser Technology
Published
2025-05-10
DOI
https://doi.org/10.1016/j.optlastec.2025.113024
Citations
1
Primary Topic
Random lasers and scattering media
Type
article
Field-Weighted Citation Impact
1.30

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article

Sectional imaging using structured detection under computational optical scanning holographic microscopy

Armin J. M. Lenz, Naru Yoneda, Enrique Tajahuerce, Luis Ordóñez et al.
1 citations
Optics & Laser Technology
Random lasers and scattering media
1.30
article

Sectional imaging using structured detection under computational optical scanning holographic microscopy

Armin J. M. Lenz, Naru Yoneda, Enrique Tajahuerce, Luis Ordóñez, Osamu Matoba, Erick Ipus, Lluís Martínez-León
article en
1 citations

Abstract

Computational optical scanning holography (COSH) is a single-pixel imaging technique that can provide holograms with a simple common-path optical setup. Although COSH can reconstruct three-dimensional (3D) objects through phase-shifting and optical backpropagation, there are defocus artifacts in reconstructed images from different axial positions, which leads to lower axial resolution. In this paper, a structured detection technique in COSH is proposed to improve the axial resolution of COSH by reducing defocus artifacts. The proposed method can improve the axial resolution with optical sectioning by structured illumination microscopy (OS-SIM) principles. In addition, the proposed method is applied to microscopy. The feasibility of the proposed method is experimentally verified.

Optics & Laser TechnologyVol. 189
Universitat Jaume I (ES), Kobe University (JP)
Generalitat Valenciana, Japan Society for the Promotion of Science, European Regional Development Fund, Agencia Estatal de Investigación
Openalex Percentile: Top 22%
Random lasers and scattering media
1.30
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