HAXPES reference spectra of orpiment (As2S3) with Cr <i>Kα</i> excitation
Hard x-ray photoelectron spectroscopy using monochromatic Cr-Kα radiation (5414.8 eV) has been used to acquire XPS and Auger data on sputtered orpiment samples. Survey data, high-resolution scans of all observed photoelectron peaks, and high-resolution scans of Auger lines are presented herein.
Authors
- William F. Stickle (ORCID: https://orcid.org/0000-0002-7971-3219)
- Christopher N. Young (ORCID: https://orcid.org/0000-0002-3346-9601)
- Dong Zheng (ORCID: https://orcid.org/0000-0002-6102-9793)
Institutions
- Hewlett-Packard (United States) (US)
Publication Details
- Journal
- Surface Science Spectra
- Published
- 2025-05-09
- DOI
- https://doi.org/10.1116/6.0004566
- Primary Topic
- Chalcogenide Semiconductor Thin Films
- Type
- article
- Field-Weighted Citation Impact
- 0.00