Design of an integrated operational amplifier parameter testing system

This paper introduces the simulation design and circuit implementation of a versatile operational amplifier (op-amp) parameter testing system. Initially, the system employs Multisim software for circuit simulation to verify the accuracy of the understanding of various op-amp parameters and the effectiveness of each component of the testing circuit. Subsequently, switch elements are utilized to combine these circuits, enabling automatic parameter measurement under the control of a microcontroller. Ultimately, utilizing GD32F303CET6 as the main controller, combined with peripheral voltage conditioning circuits, the system achieves precise measurement and display of multiple critical parameters of the op-amp, including offset voltage, offset current, open-loop differential-mode gain, gain-bandwidth product, and common mode rejection ratio. The design and implementation of this system simplify and enhance the accuracy of op-amp parameter testing, possessing high practical value.