March Cd+: novel march test algorithm for high fault coverage detection

March C+ algorithm is commonly utilized in memory testing circuits because of its relatively low complexity and high fault detection capability. However, its low complexity leads to issues such as insufficient fault differentiation and incomplete fault coverage. To address the limitations of the March C+ algorithm, this paper proposes the March Cd+ algorithm for built-in self-testing (BIST) of memory. The proposed algorithm, based on March C+, enhances fault detection by adding read and write operations within the test sequence, which sensitizes memory cell faults, enables differentiation between different types of faults, and detects fault types that were not covered by the original algorithm. The results show that the March Cd+ algorithm achieves fault coverage rates of 92.9% and 100% for algorithm complexities of 19N and 22N, respectively. This research is of significant importance in improving the efficiency of memory fault detection.