Statistical Characterization and Performance of the Extreme Two-Wave Fading Model
Several practical wireless scenarios exist where the transmitted signal might undergo severe channel fading. This work presents the Extreme Two-Wave (ETW) fading model, encompassing simultaneously the Two-Ray and the k-µ Extreme fading models, which have been shown to provide a tight fit to empirical measurements in harsh propagation conditions. The ETW model is a limiting case of the recently introduced Multicluster Two-Ray (MTW) fading model and can be used to model wireless communications links in some of the new use cases defined in 5G and beyond wireless networks in environments experiencing severe fading. The chief probability functions are obtained for the proposed ETW model, as well as the outage probability. In addition, the ETW model is extended to incorporate shadowing effects.
Authors
- Maryam Olyaee (ORCID: https://orcid.org/0000-0002-6444-7579)
- Juan M. Romero–Jerez (ORCID: https://orcid.org/0000-0001-7844-4574)
- Juan P. Peña–Martín (ORCID: https://orcid.org/0000-0002-1082-536X)
Publication Details
- Published
- 2025-03-24
- DOI
- https://doi.org/10.1109/wcnc61545.2025.10978355
- Primary Topic
- Advanced Wireless Communication Techniques
- Type
- article
- Field-Weighted Citation Impact
- 0.00