Introduction to the New “Featured MTT-S Chapters” Series [Featured MTT-S Chapters]
Provides society information that may include news, reviews or technical notes that should be of interest to practitioners and researchers.
Authors
- Dietmar Kissinger (ORCID: https://orcid.org/0000-0002-9698-4432)
- Damla Dimlioglu (ORCID: https://orcid.org/0000-0003-0533-1020)
Institutions
- Universität Ulm (DE)
- Cornell University (US)
Publication Details
- Journal
- IEEE Microwave Magazine
- Published
- 2025-05-09
- DOI
- https://doi.org/10.1109/mmm.2025.3548367
- Primary Topic
- Psychometric Methodologies and Testing
- Type
- article
- Field-Weighted Citation Impact
- 0.00