Dual threshold adaptive update algorithm for eliminating probe edge errors in reflective ptychography

This paper proposes an improved algorithm that optimizes the update range in each iteration of the sample reconstruction process, suppressing the interference of edge errors in each update and preventing erroneous information from propagating into subsequent iterations. While improving reconstruction results, the method does not introduce additional errors, ensures a stable iteration direction, and enhances convergence speed. The algorithm consists of two key steps: global error feedback adjustment and local feature adaptive adjustment. This effectively suppresses the accumulation of edge noise, reduces boundary artifacts, and enhances the recovery quality in weak-signal regions. The proposed algorithm has been validated through numerical simulations and optical experiments. It successfully eliminates artifact effects caused by edge errors in reflective ptychography, providing, to our knowledge, a novel solution for nondestructive testing and imaging of complex samples. The additional step introduces minimal additional computational cost, and the method is experimentally demonstrated in proof-of-concept benchtop experiments. This is a practical improvement to the ptychography reconstruction tool suites and can be easily extended to other ptychography/Fourier ptychography/coherent diffraction imaging reconstruction methods.

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Publication Details

Journal
Applied Optics
Published
2025-05-09
DOI
https://doi.org/10.1364/ao.560115
Primary Topic
Advanced X-ray Imaging Techniques
Type
article
Field-Weighted Citation Impact
0.00

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article

Dual threshold adaptive update algorithm for eliminating probe edge errors in reflective ptychography

Yunlong Qi, Yihan Zhao, Yishi Shi, Feiyu Duan et al.
1 links
Applied Optics
Advanced X-ray Imaging Techniques
article

Dual threshold adaptive update algorithm for eliminating probe edge errors in reflective ptychography

Yunlong Qi, Yihan Zhao, Yishi Shi, Feiyu Duan, Yun Chen, Li Su
article en

Abstract

This paper proposes an improved algorithm that optimizes the update range in each iteration of the sample reconstruction process, suppressing the interference of edge errors in each update and preventing erroneous information from propagating into subsequent iterations. While improving reconstruction results, the method does not introduce additional errors, ensures a stable iteration direction, and enhances convergence speed. The algorithm consists of two key steps: global error feedback adjustment and local feature adaptive adjustment. This effectively suppresses the accumulation of edge noise, reduces boundary artifacts, and enhances the recovery quality in weak-signal regions. The proposed algorithm has been validated through numerical simulations and optical experiments. It successfully eliminates artifact effects caused by edge errors in reflective ptychography, providing, to our knowledge, a novel solution for nondestructive testing and imaging of complex samples. The additional step introduces minimal additional computational cost, and the method is experimentally demonstrated in proof-of-concept benchtop experiments. This is a practical improvement to the ptychography reconstruction tool suites and can be easily extended to other ptychography/Fourier ptychography/coherent diffraction imaging reconstruction methods.

Applied OpticsVol. 64(18)
Hebei University of Engineering (CN), Beihua University (CN), Chinese Academy of Sciences (CN)
National Natural Science Foundation of China, Chinese Academy of Sciences, University of Chinese Academy of Sciences, National Key Research and Development Program of China, Fundamental Research Funds for the Central Universities
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Openalex Percentile: Top 88%
Advanced X-ray Imaging Techniques
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