LarGAN: A Label Auto-Rescaling Generation Adversarial Network for Rare Surface Defects

Insufficient defect data significantly limits detection accuracy in continuous casting slab production. This limitation arises from the data collection in fast-paced production environments. To address this issue, we propose LarGAN, a data augmentation approach that synthesizes similar and high-quality defect data from a single image. We utilize a progressive GAN framework to ensure a smooth and stable generation process, starting from low-resolution image synthesis and gradually increasing the network depth. We designed a Label Auto-Rescaling strategy to better adapt to defect data with annotation, enhancing both the quality and morphological diversity of the synthesized defects. To validate the generation results, we evaluate not only standard metrics, such as FID, SSIM, and LPIPS, but also performance, through the downstream detection model YOLOv8. Our experimental results demonstrate that the LarGAN model surpasses other single-image generation models in terms of image quality and diversity. Furthermore, the experiments reveal that the data generated by LarGAN effectively enhances the feature space of the original dataset, thereby improving the accuracy and generalization performance of the detection model.

Authors

Institutions

Publication Details

Journal
Sensors
Published
2025-05-08
DOI
https://doi.org/10.3390/s25102958
Primary Topic
Industrial Vision Systems and Defect Detection
Type
article
Field-Weighted Citation Impact
0.00

Funders

Controls
|||
ALL TIME
JAN
FEB
MAR
APR
MAY
JUN
JUL
AUG
SEP
OCT
article

LarGAN: A Label Auto-Rescaling Generation Adversarial Network for Rare Surface Defects

Xuezhong Huang, Lei Huang, Ke Xu, Guan Qin et al.
Sensors
Industrial Vision Systems and Defect Detection
article

LarGAN: A Label Auto-Rescaling Generation Adversarial Network for Rare Surface Defects

Xuezhong Huang, Lei Huang, Ke Xu, Guan Qin, Hanxin Zhang, Yi Wei
article en

Abstract

Insufficient defect data significantly limits detection accuracy in continuous casting slab production. This limitation arises from the data collection in fast-paced production environments. To address this issue, we propose LarGAN, a data augmentation approach that synthesizes similar and high-quality defect data from a single image. We utilize a progressive GAN framework to ensure a smooth and stable generation process, starting from low-resolution image synthesis and gradually increasing the network depth. We designed a Label Auto-Rescaling strategy to better adapt to defect data with annotation, enhancing both the quality and morphological diversity of the synthesized defects. To validate the generation results, we evaluate not only standard metrics, such as FID, SSIM, and LPIPS, but also performance, through the downstream detection model YOLOv8. Our experimental results demonstrate that the LarGAN model surpasses other single-image generation models in terms of image quality and diversity. Furthermore, the experiments reveal that the data generated by LarGAN effectively enhances the feature space of the original dataset, thereby improving the accuracy and generalization performance of the detection model.

SensorsVol. 25(10)
Guangxi Research Institute of Chemical Industry (CN), University of Science and Technology Beijing (CN)
Key Technologies Research and Development Program, Beijing Science and Technology Planning Project
Openalex Percentile: Top 87%
Industrial Vision Systems and Defect Detection
AI Navigator

Ask Laika to Summarize, Analyze, and Connect papers live on the map.

Summarize Papers & Methodologies

Extract key findings, datasets, and comparative methods across publications.

Benchmark Rankings & Visual Analytics

Rank top research institutions, authors, funders, topics, and journals by Field-Weighted Citation Impact (FWCI) and paper volume with instant charts.

Connect Distant Disciplines

Bridge topological clusters on the map to find hidden collaborative intersections.

LarGAN: A Label Auto-Rescaling Generation Adversarial Network for Rare Surface Defects — Xuezhong Huang, Lei Huang, et al. · Sensors (2025) | TGRS Research Map | TGRS