Aqueous Method Synthesis and Characterization of SiO2@CsPbBr3 Thin Film Structured Materials

Nanocrystalline CsPbBr3 and CsPbBr3 phosphor layers were successfully deposited onto monodisperse, spherical, and non-aggregated SiO2 particles using an aqueous synthesis method. This process led to the formation of SiO2@CsPbBr3 thin-film structured materials. The structural, morphological, and optical properties of the resulting materials were systematically investigated through X-ray diffraction (XRD), scanning electron microscopy (SEM), photoluminescence (PL) spectroscopy, and UV-visible absorption spectroscopy. XRD results confirmed the successful coating of CsPbBr3 layers on the SiO₂ surfaces, this finding further verified by SEM images. The photoluminescence spectra revealed that the SiO2@CsPbBr3 thin film materials exhibited a prominent green emission band, with maximum at 507 nm, indicating their potential in optoelectronic and photonic applications.

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Journal
Metallurgical and Materials Engineering
Published
2025-04-16
DOI
https://doi.org/10.63278/1429
Primary Topic
Advanced Chemical Sensor Technologies
Type
article
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article

Aqueous Method Synthesis and Characterization of SiO2@CsPbBr3 Thin Film Structured Materials

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article

Aqueous Method Synthesis and Characterization of SiO2@CsPbBr3 Thin Film Structured Materials

Sanjay R. Thakare, Arjun V. Mane, Mamata R. Lanjewar, Yogesh Ghogare, Twinkle S. Wankhede
article en

Abstract

Nanocrystalline CsPbBr3 and CsPbBr3 phosphor layers were successfully deposited onto monodisperse, spherical, and non-aggregated SiO2 particles using an aqueous synthesis method. This process led to the formation of SiO2@CsPbBr3 thin-film structured materials. The structural, morphological, and optical properties of the resulting materials were systematically investigated through X-ray diffraction (XRD), scanning electron microscopy (SEM), photoluminescence (PL) spectroscopy, and UV-visible absorption spectroscopy. XRD results confirmed the successful coating of CsPbBr3 layers on the SiO₂ surfaces, this finding further verified by SEM images. The photoluminescence spectra revealed that the SiO2@CsPbBr3 thin film materials exhibited a prominent green emission band, with maximum at 507 nm, indicating their potential in optoelectronic and photonic applications.

Metallurgical and Materials EngineeringVol. 31(4)
Ambedkar University Delhi (IN), Central Forensic Science Laboratory (IN)
Openalex Percentile: Top 91%
Advanced Chemical Sensor Technologies
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