Enhancement of Simulation Correlation in Pogo Pin Socket

Pogo-pin sockets are widely used in semiconductor testing due to their ability to accommodate large-area semiconductor packages and their short pad spacing. Therefore, analyzing the signal transmission characteristics of pogo-pin sockets is becoming increasingly important. During the analysis, the correlation between the measurement and simulation results was compromised. In this study, variables were set to model the measurement environment in a similar manner. These variables were applied to the simulation by reflecting the actual measurement results and the validated theoretical model. The simulation with the variables was shown to have an improved correlation as compared with the design-based simulation, and the results of the simulation with and without the variables were analyzed and compared with the measurements to verify the effectiveness of the improvement in correlation.