Testing High-dimensional White Noise Based On Modified Portmanteau Tests

For high-dimensional time series, we propose a new test to detect white noise that is not necessarily assumed to be independent and identically distributed.The test can be viewed as a modified portmanteau test in high dimensions, and the critical value of the test statistic is approximated by a multiplier bootstrap method.We provide asymptotic properties of our test under the null hypothesis.The usefulness of our tests is demonstrated by simulations and one real example, particularly for detecting dense alternatives.

Authors

Publication Details

Journal
Statistica Sinica
Published
2025-05-08
DOI
https://doi.org/10.5705/ss.202024.0037
Primary Topic
Advanced Statistical Process Monitoring
Type
article
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article

Testing High-dimensional White Noise Based On Modified Portmanteau Tests

Min Chen, Zeren Zhou
Statistica Sinica
Advanced Statistical Process Monitoring
article

Testing High-dimensional White Noise Based On Modified Portmanteau Tests

Min Chen, Zeren Zhou
article en

Abstract

For high-dimensional time series, we propose a new test to detect white noise that is not necessarily assumed to be independent and identically distributed.The test can be viewed as a modified portmanteau test in high dimensions, and the critical value of the test statistic is approximated by a multiplier bootstrap method.We provide asymptotic properties of our test under the null hypothesis.The usefulness of our tests is demonstrated by simulations and one real example, particularly for detecting dense alternatives.

Statistica Sinica
Openalex Percentile: Top 90%
Advanced Statistical Process Monitoring
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Testing High-dimensional White Noise Based On Modified Portmanteau Tests — Min Chen, Zeren Zhou · Statistica Sinica (2025) | TGRS Research Map | TGRS