Pockels effect in CVD-grown monolayer MoS<sub>2</sub>
Abstract We have studied the Pockels effect, that is, the linear change in the refractive index of piezoelectric materials in response to an electric field, in monolayer and bilayer MoS 2 films grown by a chemical vapor deposition method. Optical imaging of the polarization rotation of the reflected light reveals that the polarization plane rotates by the application of an electric field only in monolayer MoS 2 which lacks inversion symmetry. The Pockels coefficient r 22 is estimated to be −1.4 pm V −1 for monolayer MoS 2 , which is comparable to the magnitude reported for GaAs.
Authors
- Yasumitsu Miyata (ORCID: https://orcid.org/0000-0002-9733-5119)
- Yuki Shiomi (ORCID: https://orcid.org/0000-0002-2446-2205)
- Tomoyuki Yokouchi (ORCID: https://orcid.org/0000-0003-4078-2740)
- M. Tanabe
- Ritsuki Okukawa
Institutions
- National Institute for Materials Science (JP)
- RIKEN Center for Emergent Matter Science (JP)
- Tokyo Metropolitan University (JP)
- The University of Tokyo (JP)
Publication Details
- Journal
- Japanese Journal of Applied Physics
- Published
- 2025-05-01
- DOI
- https://doi.org/10.35848/1347-4065/add5b2
- Primary Topic
- Molecular Junctions and Nanostructures
- Type
- article
- Field-Weighted Citation Impact
- 0.00
Funders
- Japan Society for the Promotion of Science
- Fusion Oriented REsearch for disruptive Science and Technology