A 4.447 mW at 100 MHz and 49.62% Uniqueness XNOR–XOR RO PUF ASIC Using 180-nm CMOS Process for IoT Security Applications

Physical unclonable functions (PUFs) are increasingly recognized as a key technology for enhancing hardware and the Internet of Things (IoT) security. The IoT devices are often plagued by weak security measures, making them susceptible to various external threats. To address these vulnerabilities, robust and reliable security solutions are critical. This study introduces a highly reliable and low-power PUF application-specific integrated circuit (ASIC) design specifically designed for the IoT security applications. Initially, the proposed design is deployed on a Xilinx ZYNQ 7000 field-programmable gate array (FPGA) board operating at 100 MHz and later designed and fabricated using the Cadence Innovus in the 180-nm CMOS process on silicon. This work presents and evaluates a novel <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xnor</small>–<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xor</small> ring oscillator (RO) PUF with a configurable frequency. The design’s performance is analyzed using statistical metrics, including reliability, uniqueness, and uniformity. The <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xnor</small>–<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xor</small> RO PUF ASIC demonstrates max reliability of 91.92%, a uniqueness of 49.62%, and a uniformity of 50.19% on silicon.

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Publication Details

Journal
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Published
2025-05-06
DOI
https://doi.org/10.1109/tvlsi.2025.3563386
Citations
1
Primary Topic
Integrated Circuits and Semiconductor Failure Analysis
Type
article
Field-Weighted Citation Impact
0.73
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article

A 4.447 mW at 100 MHz and 49.62% Uniqueness XNOR–XOR RO PUF ASIC Using 180-nm CMOS Process for IoT Security Applications

Pradyumna Vellanki, Ralph Gerard B. Sangalang, Chua‐Chin Wang, Jianjie Chen
1 citations
IEEE Transactions on Very Large Scale Integration (VLSI) Systems
Integrated Circuits and Semiconductor Failure Analysis
0.73
article

A 4.447 mW at 100 MHz and 49.62% Uniqueness XNOR–XOR RO PUF ASIC Using 180-nm CMOS Process for IoT Security Applications

Pradyumna Vellanki, Ralph Gerard B. Sangalang, Chua‐Chin Wang, Jianjie Chen
article en
1 citations

Abstract

Physical unclonable functions (PUFs) are increasingly recognized as a key technology for enhancing hardware and the Internet of Things (IoT) security. The IoT devices are often plagued by weak security measures, making them susceptible to various external threats. To address these vulnerabilities, robust and reliable security solutions are critical. This study introduces a highly reliable and low-power PUF application-specific integrated circuit (ASIC) design specifically designed for the IoT security applications. Initially, the proposed design is deployed on a Xilinx ZYNQ 7000 field-programmable gate array (FPGA) board operating at 100 MHz and later designed and fabricated using the Cadence Innovus in the 180-nm CMOS process on silicon. This work presents and evaluates a novel <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xnor</small>–<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xor</small> ring oscillator (RO) PUF with a configurable frequency. The design’s performance is analyzed using statistical metrics, including reliability, uniqueness, and uniformity. The <sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xnor</small>–<sc xmlns:mml="http://www.w3.org/1998/Math/MathML" xmlns:xlink="http://www.w3.org/1999/xlink">xor</small> RO PUF ASIC demonstrates max reliability of 91.92%, a uniqueness of 49.62%, and a uniformity of 50.19% on silicon.

IEEE Transactions on Very Large Scale Integration (VLSI) SystemsVol. 33(10)
National Sun Yat-sen University (TW), Batangas State University (PH)
Openalex Percentile: Top 29%
Integrated Circuits and Semiconductor Failure Analysis
0.73
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A 4.447 mW at 100 MHz and 49.62% Uniqueness XNOR–XOR RO PUF ASIC Using 180-nm CMOS Process for IoT Security Applications — Pradyumna Vellanki, Ralph Gerard B. Sangalang, et al. · IEEE Transactions on Very Large Scale Integration (VLSI) Systems (2025) | TGRS Research Map | TGRS