Laser‐Induced Crystallization and Oxidation Phase Diagrams for High‐Throughput Evaluation of MoS<sub>2</sub>/MoO<sub>x</sub> Optical Thin Films

Abstract The development of thin film materials for optoelectronic and meta‐optic applications requires the discovery of novel materials and reliable control over their optical constants during the growth process. In this work, localized laser oxidation and crystallization are used to tailor the optical constants of an amorphous MoS 2 precursor thin film. By scanning focused laser light across multiple films with varying intensity and speed in a controlled oxygen environment, the transient heating associated with this technique is used to control the localized oxidation of each film. Characterization of the laser‐processed regions results in synthesis phase diagrams indicating the laser conditions at which each oxide phase is formed. The optical constants of each phase are also measured, showing changes in refractive index Δ n and extinction coefficient Δ k as large as Δ n = 0.43 and Δ k = 0.35 for MoS 2 , Δ n = 1.7 and Δ k = 1.6 for MoO 3 , and Δ n = 1.7 and Δ k = 1.3 for MoO 2 . These changes are attributed to oxygen dopants, strain, improved crystallinity for MoS 2 , and oxygen vacancies and sulfur dopants for the oxide phases. These findings demonstrate the versatility of the laser processing approach for the highly controlled tailoring of thin film optical properties for high‐throughput materials discovery.

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Publication Details

Journal
Advanced Optical Materials
Published
2025-05-05
DOI
https://doi.org/10.1002/adom.202500190
Citations
2
Primary Topic
Chalcogenide Semiconductor Thin Films
Type
article
Field-Weighted Citation Impact
1.46

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Laser‐Induced Crystallization and Oxidation Phase Diagrams for High‐Throughput Evaluation of MoS2/MoOx Optical Thin Films

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Chalcogenide Semiconductor Thin Films
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article

Laser‐Induced Crystallization and Oxidation Phase Diagrams for High‐Throughput Evaluation of MoS2/MoOx Optical Thin Films

Christopher Muratore, Brian M. Everhart, Peter R. Stevenson, Nicholas R. Glavin, Michael E. McConney, Michael Altvater, Benjamin Robertson, Arthur R. Woll, Drake Austin, Mario Hofmann, Lirong Sun
article en
2 citations

Abstract

Abstract The development of thin film materials for optoelectronic and meta‐optic applications requires the discovery of novel materials and reliable control over their optical constants during the growth process. In this work, localized laser oxidation and crystallization are used to tailor the optical constants of an amorphous MoS 2 precursor thin film. By scanning focused laser light across multiple films with varying intensity and speed in a controlled oxygen environment, the transient heating associated with this technique is used to control the localized oxidation of each film. Characterization of the laser‐processed regions results in synthesis phase diagrams indicating the laser conditions at which each oxide phase is formed. The optical constants of each phase are also measured, showing changes in refractive index Δ n and extinction coefficient Δ k as large as Δ n = 0.43 and Δ k = 0.35 for MoS 2 , Δ n = 1.7 and Δ k = 1.6 for MoO 3 , and Δ n = 1.7 and Δ k = 1.3 for MoO 2 . These changes are attributed to oxygen dopants, strain, improved crystallinity for MoS 2 , and oxygen vacancies and sulfur dopants for the oxide phases. These findings demonstrate the versatility of the laser processing approach for the highly controlled tailoring of thin film optical properties for high‐throughput materials discovery.

Advanced Optical MaterialsVol. 13(17)
University of Dayton (US), United States Air Force Research Laboratory (US), National Taiwan University (TW), National Academies of Sciences, Engineering, and Medicine (US), Cornell University (US), Wright-Patterson Air Force Base (US), Edaptive Computing (United States) (US), U.S. Air Force Research Laboratory Materials and Manufacturing Directorate
Asian Office of Aerospace Research and Development, National Science Council, National Science and Technology Council, Air Force Research Laboratory
Openalex Percentile: Top 18%
Chalcogenide Semiconductor Thin Films
1.46
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